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A Study on the Application of Deep Learning Model by Using ACR Phantom in CT Quality Control

Eun-Been Choi, Si-On Kim, Seung-Won Choi, Jae-Hee Kim, Young-Kyun Kim, Dong-Kyun Han

Journal of Radiological Science and Technology :: Vol.46 No.6 pp.535-542

DOI:https://doi.org/10.17946/JRST.2023.46.6.535
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